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Search for "off-resonance tapping (ORT)" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13
- at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. These modes offer precise and stable control of vertical
- rate and therefore enables higher scan rates while refining the mechanical property mapping. Keywords: atomic force microscopy (AFM); feedback control; off-resonance tapping (ORT); pulsed-force mode; Introduction Constant force mode, a widely used AFM imaging mode, utilizes a feedback controller that
- to these modes (that tap on the surface at a frequency far from the cantilevers’ resonance frequency) from now on in this manuscript generically as off-resonance tapping (ORT) modes. Despite its many benefits, ORT has the drawback of limited scan speed, which stems from the frequency of actuation and
An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111
- ) and a stick–slip controller (8742-4 PicomotorTM drive, Newport Corporation). The AFM can operate in contact mode and in an off-resonance mode based on force–distance curves [24]. In this off-resonance mode, which we refer to as off-resonance tapping (ORT), the cantilever is moved sinusoidally up and
- closed-loop sensor data obtained prior to imaging on the AFM scan head. For Figure 2, the AFM image shown was recorded at 300 mHz line rate at a resolution of 1024 pixels and 512 lines and over a scan range of 30 × 30 µm. The imaging mode used was off-resonance tapping (ORT) at a tapping rate of 2 kHz
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